TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness

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TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness

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TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness

92% High Quantum Spectrometer for Film Thickness Measurement The widespread use of thin films in high-tech industries necessitates advanced thickness assessment methods. Photoelectric technology ...

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Non Destructive Fiber Optic Spectrometer

1100nm Fiber Optic Spectrometer

TE Cooled Fiber Optic Spectrometer

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